DocumentCode :
1542592
Title :
Characterization of thin back-to-back CdTe detectors
Author :
Auricchio, Natalia ; Caroli, Ezio ; Denati, A. ; Dusi, Waldes ; Fougeres, Paul ; Grassi, Donato ; Perillo, Eugenio ; Siffert, Paul
Author_Institution :
Istituto TESRE, CNR, Bologna, Italy
Volume :
48
Issue :
4
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Firstpage :
1028
Lastpage :
1032
Abstract :
Thin CdTe detectors (3×5 mm2 electrode area, 0.5 and 0.8 mm thick), mounted in back-to-back configuration with common anode have been characterized. This configuration allows one to double the useful absorbing thickness in the classical planar parallel field (PPF) irradiation geometry and to double the sensitive area in the planar transverse field (PTF) geometry, while maintaining the same interelectrode distance (0.5 or 0.8 mm) and one electronic chain as for single detectors. The tests performed aim at understanding the effects on the spectroscopic performance of various interelectrode distances and in particular of the chemical and mechanical treatments used to make thin detectors. A narrow photon beam, 10-150 keV in energy, obtained using a 20-mm-thick tungsten collimator, was employed. The results obtained, compared with previous measurements on various thicknesses devices, indicate that the optimum single detector thickness is 1 mm
Keywords :
II-VI semiconductors; cadmium compounds; gamma-ray detection; semiconductor counters; wide band gap semiconductors; CdTe; W; back-to-back configuration; classical planar parallel field irradiation geometry; interelectrode distance; planar transverse field geometry; spectroscopic performance; thin back-to-back CdTe detectors; tungsten collimator; Anodes; Chemicals; Detectors; Electrodes; Geometry; Optical collimators; Performance evaluation; Spectroscopy; Testing; Tungsten;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.958718
Filename :
958718
Link To Document :
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