DocumentCode :
1542724
Title :
A low power 12 bit flux shuttle shift register with Nb technology
Author :
Lochschmied, R. ; Herwig, R. ; Neuhaus, M. ; Jutzi, W.
Author_Institution :
Inst. fur Electrotech. Grundlagen der Inf., Karlsruhe Univ., Germany
Volume :
7
Issue :
2
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
2983
Lastpage :
2986
Abstract :
A 12 bit Flux Shuttle shift register with a new write and readout gate has been simulated and fabricated using Nb/Al/sub 2/O/sub 3//Nb Josephson junctions. Write, shift and read operations have been tested successfully at 4.2 K. Drive currents are independent from input bit sequence. Although measurements were disturbed by trapped flux, minimum margins are /spl Delta/I=/spl plusmn/10%. The power dissipation of a shift register cell is 9 nW/GHz. Total power losses caused by terminating resistors are 70 /spl mu/W. The minimum line width may be scaled down to 0.5 /spl mu/m, because power losses per unit area of long Flux Shuttle shift registers are extremely low.
Keywords :
Josephson effect; alumina; niobium; shift registers; superconducting logic circuits; 0.5 micron; 12 bit; 4.2 K; 70 muW; Nb technology; Nb-Al/sub 2/O/sub 3/-Nb; Nb/Al/sub 2/O/sub 3//Nb Josephson junction; flux shuttle shift register; line width; low power circuit; power dissipation; power loss; readout gate; write gate; Circuits; Clocks; Josephson junctions; Niobium; Power dissipation; Resistors; Shift registers; Switches; Testing; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.621945
Filename :
621945
Link To Document :
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