• DocumentCode
    1543320
  • Title

    Heat transport across the interface between normal metal and d-wave superconductor

  • Author

    Devyatov, I.A. ; Kupriyanov, M.Yu. ; Golubov, A.A. ; Kuzmin, L. ; Willander, M.

  • Author_Institution
    Inst. of Nucl. Phys., Moscow State Univ., Russia
  • Volume
    9
  • Issue
    2
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    3870
  • Lastpage
    3873
  • Abstract
    Heat conductance and heat current across normal metal/d-wave superconductor (NID) interface are calculated in the framework of quasiclassical equations. The calculations are performed for different values of boundary transparencies and crystal axis orientation. It is shown that in contrast to N/s-wave boundary the heat conductance of transparent (D=1) NID interface is considerably larger and has a nonactivated form. Electronic heat current across NID structures is also calculated for different interface models taking into account the midgap states and the possibility of generating a gapless s-wave state in the vicinity of rough NID interface. It is shown that NID junctions cannot compete with analogous NIS devices in microrefrigerating and bolometer applications.
  • Keywords
    BCS theory; high-temperature superconductors; proximity effect (superconductivity); superconducting energy gap; thermal conductivity; thermoelectricity; Andreev states; BCS theory; HTSC electrode; bolometer applications; boundary transparencies; crystal axis orientation; diffusive interface; gapless s-wave state; heat conductance; heat current; heat transport; interface models; microrefrigerating; midgap states; normal metal/d-wave superconductor interface; proximity effect; quasiclassical equations; rough interface; transparent interface; Electrodes; Electrons; Heat transfer; High temperature superconductors; Josephson junctions; Refrigeration; Superconducting devices; Superconducting photodetectors; Thermoelectricity; Tin;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.783872
  • Filename
    783872