• DocumentCode
    15435
  • Title

    Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization

  • Author

    Bernieri, Andrea ; Betta, Giovanni ; Ferrigno, L. ; Laracca, Marco ; Mastrostefano, Stefano

  • Author_Institution
    Dept. of Electr. & Inf. Eng., Maurizio Scarano Univ. of Cassino & Southern Lazio, Cassino, Italy
  • Volume
    63
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1272
  • Lastpage
    1280
  • Abstract
    Eddy current testing (ECT) has three main tasks: detection, location, and characterization of defects. The characterization task, which means the ability to find the geometrical characteristics of the defect, is still in the research domain, although in many industrial applications this task has to be carried out with good accuracy to allow reliable acceptance or rejection decision indispensable to save costs and even human lives. This paper proposes an ECT measurement method that allows the reliable estimation of the geometrical characteristics of thin defects (i.e., length, height, and depth) by using a combination of a multifrequency excitation and an optimized support vector machine for regression. The proposed solution is tested on real specimens with known cracks by using a suitable measurement setup comprising a giant magnetoresistance-based biaxial ECT probe.
  • Keywords
    cracks; eddy current testing; giant magnetoresistance; magnetoresistive devices; regression analysis; support vector machines; ECT defect characterization; cracks; eddy current testing; geometrical characteristics; giant magnetoresistance-based biaxial ECT probe; multifrequency excitation; support vector machine regressor; thin defects; Coils; Data mining; Feature extraction; Materials; Probes; Reliability; Software; Defect characterization; giant magnetoresistance (GMR) sensor; multifrequency eddy current testing (ECT); nondestructive testing (NDT); signal processing; support vector machine;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2292326
  • Filename
    6679272