Superconductor-insulator-normal tunnel junctions for on-chip measurement of the temperature

Author

Castellano, M.G. ; Leoni, R. ; Torrioli, G. ; Carelli, P. ; Gerardino, A. ; Melchiorri, F.

Author_Institution

Ist. di Elettronica dello Stato Solido, CNR, Rome, Italy

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

3251

Lastpage

3254

Abstract

We describe SIN (superconductor-insulator-normal) tunnel junctions made by thin-films of Nb/AlOx/Cu and we report on the measurements of their I-V characteristics between 10 K and 0.3 K. The junctions show a strong dependence of the subgap conductance on the temperature, which makes them suitable for the on-chip measurement of the temperature. In this paper we also describe the design of an on-chip electronic refrigerator based on this type of junction.

Keywords

alumina; copper; niobium; refrigeration; superconducting device testing; superconducting junction devices; temperature measurement; 0.3 to 10 K; I-V characteristics; Nb-AlO-Cu; Nb/AlO/sub x//Cu thin films; on-chip electronic refrigerator; on-chip temperature measurement; strong temperature dependence; subgap conductance; superconductor-insulator-normal tunnel junctions; Bolometers; Electrodes; Electrons; Josephson junctions; Niobium; Refrigeration; Silicon compounds; Superconducting photodetectors; Temperature dependence; Temperature measurement;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.622042

Filename

622042