DocumentCode :
1544743
Title :
A structure-oriented power modeling technique for macrocells
Author :
Lin, Jiing-Yuan ; Shen, Wen-Zen ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
7
Issue :
3
fYear :
1999
Firstpage :
380
Lastpage :
391
Abstract :
To characterize the power consumption of a macrocell, a general method involves recording the power consumption of all possible input transition events in the look-up tables. However, though this approach is accurate, the size of the table becomes very large. In this paper, we propose a new power modeling technique that takes advantage of the structural information of a macrocell. In this approach, a subset of primary inputs and internal nodes in the macrocell are selected as the state variables to build a state transition graph (STG). These state variables can model the steady-state transitions completely. Moreover, by selecting the characterization patterns properly, the STG can also model the glitch power in the macrocell accurately. To further simplify the complexity of the STG, an incomplete power modeling technique is presented. Without losing much accuracy, the property of compatible patterns is exploited for a macrocell to further reduce the number of edges in the corresponding STG. Experimental results show that our modeling techniques can provide SPICE-like accuracy, while the size of the look-up table is significantly reduced.
Keywords :
VLSI; circuit analysis computing; digital integrated circuits; graph theory; integrated circuit modelling; table lookup; STG; characterization patterns; glitch power; input transition events; look-up table size reduction; macrocells; power consumption; state transition graph; state variables; steady-state transitions modelling; structure-oriented power modeling technique; Application specific integrated circuits; Central Processing Unit; Circuit simulation; Energy consumption; Macrocell networks; SPICE; Statistics; Steady-state; Table lookup; Very large scale integration;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.784099
Filename :
784099
Link To Document :
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