DocumentCode :
1545283
Title :
A 76-mm2 8-Mb chain ferroelectric memory
Author :
Takashima, Daisaburo ; Takeuchi, Yoshiaki ; Miyakawa, Tadashi ; Itoh, Yasuo ; Ogiwara, Ryu ; Kamoshida, Masahiro ; Hoya, Katsuhiko ; Doumae, Sumiko Mano ; Ozaki, Tohru ; Kanaya, Hiroyuki ; Yamakawa, Koji ; Kunishima, Iwao ; Oowaki, Yukihito
Author_Institution :
Memory LSI Res. & Dev. Center, Toshiba Corp., Yokohama, Japan
Volume :
36
Issue :
11
fYear :
2001
fDate :
11/1/2001 12:00:00 AM
Firstpage :
1713
Lastpage :
1720
Abstract :
This paper demonstrates the first 8-Mb chain ferroelectric RAM (chain FeRAM) with 0,25-μm 2-metal CMOS technology. A small die of 76 mm2 and a high average cell/chip area efficiency of 57.4 % have been realized by introducing not only chain architecture but also four new techniques: 1) a one-pitch shift cell realizes small cell size of 5.2 μm2; 2) a new hierarchical wordline architecture reduces row-decoder and plate-driver areas without an extra metal layer; 3) a small-area dummy cell scheme reduces dummy capacitor size to 1/3 of the conventional one; and 4) a new array activation scheme reduces dataline and second amplifier areas. As a result, the chain architecture with these new techniques reduces die size to 65% of that of the conventional FeRAM. Moreover a ferroelectric capacitor overdrive scheme enables sufficient polarization switching, without overbias memory cell array. This scheme lowers the minimum operation voltage by 0.23 V, and enables 2.5-V Vdd operation. Thanks to fast cell plateline drive of chain architecture, the 8-Mb chain FeRAM has achieved the fastest random access time, 40 ns, and read/write cycle time, 70 ns, at 3.0 V so far reported
Keywords :
ferroelectric capacitors; ferroelectric storage; ferroelectric switching; low-power electronics; memory architecture; random-access storage; 2.5 V; 76 mm; 8 Mbit; CMOS technology; array activation scheme; chain FRAM; chain architecture; fast cell plateline drive; ferroelectric capacitor overdrive scheme; hierarchical wordline architecture; low voltage design; minimum operation voltage; nonvolatile memory; one-pitch shift cell; polarization switching; small-area dummy cell scheme; CMOS technology; Capacitors; Driver circuits; Ferroelectric films; Ferroelectric materials; Nonvolatile memory; Paper technology; Polarization; Random access memory; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.962293
Filename :
962293
Link To Document :
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