DocumentCode :
1545771
Title :
Step-stress life-testing with random stress-change times for exponential data
Author :
Xiong, Chengjie ; Milliken, George A.
Author_Institution :
Dept. of Math, Southeast Missouri State Univ., Cape Girardeau, MO, USA
Volume :
48
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
141
Lastpage :
148
Abstract :
This paper studies statistical models in step-stress accelerated life-testing when the stress-change times are random. The marginal lifetime distribution of a test unit under a step-stress test plan when the stress change times are random variables is presented. Maximum likelihood estimates for model parameters based on both the marginal and conditional life distributions are considered. An optimum test plan is explored for simple step-stress test when the stress change time is an order statistic from the exponential lifetime under the low-stress level
Keywords :
exponential distribution; life testing; maximum likelihood estimation; random processes; Fisher information; accelerated life-testing; asymptotic variance; conditional life distribution; confidence interval; cumulative exposure model; exponential data; exponential distribution; exponential lifetime; low-stress level; marginal lifetime distribution; maximum likelihood estimates; model parameters; optimum test plan; order statistics; random stress-change times; random variables; statistical models; step-stress life-testing; test unit; Acceleration; Exponential distribution; Life estimation; Life testing; Maximum likelihood estimation; Parameter estimation; Random variables; Statistical analysis; Statistical distributions; Stress;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.784272
Filename :
784272
Link To Document :
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