A new finite-element solution for parameter extraction of multilayer and multiconductor interconnects

Author

Zhao, Yang ; Wang, Yun-yi

Volume

7

Issue

6

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

156

Lastpage

158

Abstract

In this letter, the geometry-independent measured equation of invariance is adopted with the finite-element method for mesh truncation and is successfully used in parameter extraction of interconnects. The major advantage is overcoming the tedious closed-form Green´s function deduction and disagreeable Sommerfeld integral calculation for multilayer and multiconductor structures. Moreover, the high-order finite-element is employed to increase the accuracy and save computer resources. Furthermore, an optimizing numerical scheme, which is found to be very efficient, is developed to solve finite-element equations

Keywords

finite element analysis; integrated circuit interconnections; integrated circuit packaging; transmission line theory; FEM; finite-element solution; high-order finite-element; measured equation of invariance; mesh truncation; multiconductor interconnects; multilayer interconnects; optimizing numerical scheme; parameter extraction; Boundary conditions; Differential equations; Electromagnetic measurements; Electromagnetic scattering; Finite element methods; Helium; Integral equations; Nonhomogeneous media; Parameter extraction; Perfectly matched layers;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.585201

Filename

585201