DocumentCode :
1546894
Title :
Analytical model for switching transitions of submicron CMOS logics
Author :
Park, Heung-Joon ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
32
Issue :
6
fYear :
1997
fDate :
6/1/1997 12:00:00 AM
Firstpage :
880
Lastpage :
889
Abstract :
We propose a new analytical model for the switching characteristics of CMOS logics. Our new model, named the Switching Response of CMOS logic by Convolution approach (SRC), can successfully produce the output waveforms under any switching conditions with simple analytical expressions. SRC modeling is a process of transforming CMOS logic into a linear system. This model provides procedures to determine the transfer function and the driving function (input of linear system) of the linear system from given CMOS logic, and then an output waveform, expressed as a third-order equation, is obtained by the convolution of two functions. All parameters in this model are determined in a straightforward manner from given device characteristics and layout geometry without empirical or fitting processes and presimulations. In addition, a delay equation is developed based upon the SRC model. With this delay equation, the delay can be predicted within a few percent differences compared to SPICE simulation results for the wide range of input transition time and output loading capacitance
Keywords :
CMOS logic circuits; convolution; delays; integrated circuit modelling; linearisation techniques; nonlinear network analysis; transfer functions; transient analysis; SPICE simulation results; analytical model; delay equation; driving function; input transition time; linear system transformation; output loading capacitance; output waveforms; submicron CMOS logics; switching response of CMOS logic by convolution approach; switching transitions; third-order equation; transfer function; Analytical models; CMOS logic circuits; CMOS process; Convolution; Delay effects; Equations; Linear systems; Logic devices; Semiconductor device modeling; Transfer functions;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.585290
Filename :
585290
Link To Document :
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