Title :
A New Artificial Line for Testing High-Voltage Circuit Breakers
Author :
van der Linden, W.A. ; van der Sluis, L.
Author_Institution :
KEMA High-Power Laboratories, Arnhem, The Netherlands
fDate :
4/1/1983 12:00:00 AM
Keywords :
Circuit breakers; Circuit faults; Circuit optimization; Circuit testing; Delay effects; Inductors; Laboratories; Optical fiber testing; Power generation economics; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1983.5519092