DocumentCode
1548089
Title
A thermal-fully hydrodynamic model for semiconductor devices and applications to III-V HBT simulation
Author
Benvenuti, Augusto ; Coughrau, W.M. ; Pinto, Mark R.
Author_Institution
Dipartimento di Elettronica, Politecnico di Torino, Italy
Volume
44
Issue
9
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
1349
Lastpage
1359
Abstract
Because of the interaction between self-heating and hot carriers effects, neither isothermal nor conventional macrothermal models are adequate for the simulation of state-of-the-art power devices; instead, a detailed electro-thermal model accounting for nonstationary transport, such as the Thermal-Fully Hydrodynamic (T-FH) model, is required. We apply a one-dimensional (1-D) implementation of such a model to the simulation of AlGaAs/GaAs and InP/InGaAs Heterojunction Bipolar Transistors (HBTs), comparing the results with those provided by simplified models, and highlighting how deeply both nonlocal transport and self-heating affect the predicted device performance. The importance of the convective terms is assessed, and a new nonthermal mechanism for the output Negative Differential Resistance (NDR) is proposed
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; hot carriers; indium compounds; negative resistance; semiconductor device models; 1D implementation; AlGaAs-GaAs; AlGaAs/GaAs; HBT simulation; III-V semiconductors; InP-InGaAs; InP/InGaAs; electro-thermal model; hot carriers effects; nonlocal transport; output negative differential resistance; self-heating effects; thermal-fully hydrodynamic model; Charge carrier processes; Gallium arsenide; Heterojunction bipolar transistors; Hot carrier effects; Hydrodynamics; III-V semiconductor materials; Isothermal processes; Predictive models; Semiconductor devices; Substrates;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.622585
Filename
622585
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