• DocumentCode
    1548089
  • Title

    A thermal-fully hydrodynamic model for semiconductor devices and applications to III-V HBT simulation

  • Author

    Benvenuti, Augusto ; Coughrau, W.M. ; Pinto, Mark R.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Torino, Italy
  • Volume
    44
  • Issue
    9
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    1349
  • Lastpage
    1359
  • Abstract
    Because of the interaction between self-heating and hot carriers effects, neither isothermal nor conventional macrothermal models are adequate for the simulation of state-of-the-art power devices; instead, a detailed electro-thermal model accounting for nonstationary transport, such as the Thermal-Fully Hydrodynamic (T-FH) model, is required. We apply a one-dimensional (1-D) implementation of such a model to the simulation of AlGaAs/GaAs and InP/InGaAs Heterojunction Bipolar Transistors (HBTs), comparing the results with those provided by simplified models, and highlighting how deeply both nonlocal transport and self-heating affect the predicted device performance. The importance of the convective terms is assessed, and a new nonthermal mechanism for the output Negative Differential Resistance (NDR) is proposed
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; hot carriers; indium compounds; negative resistance; semiconductor device models; 1D implementation; AlGaAs-GaAs; AlGaAs/GaAs; HBT simulation; III-V semiconductors; InP-InGaAs; InP/InGaAs; electro-thermal model; hot carriers effects; nonlocal transport; output negative differential resistance; self-heating effects; thermal-fully hydrodynamic model; Charge carrier processes; Gallium arsenide; Heterojunction bipolar transistors; Hot carrier effects; Hydrodynamics; III-V semiconductor materials; Isothermal processes; Predictive models; Semiconductor devices; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.622585
  • Filename
    622585