DocumentCode :
1548388
Title :
Measurement of the absolute penetration depth and surface resistance of superconductors using the variable spacing parallel plate resonator
Author :
Talanov, V.V. ; Mercaldo, L.V. ; Anlage, S.M.
Author_Institution :
Dept. of Phys., Maryland Univ., College Park, MD, USA
Volume :
9
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
2179
Lastpage :
2182
Abstract :
We have developed a modified Parallel Plate Transmission Line Resonator with a smoothly variable thickness of the dielectric spacer filled by liquid nitrogen. A cryogenic linear stage is made to vary the spacer from 200 /spl mu/m down to contact with 0.1 /spl mu/m resolution. Estimates of the absolute penetration depth and the surface resistance are based on the analysis of the spacer thickness dependencies of the resonator frequency and Q-factor. The measurements are performed at fixed temperature (77 K), so the result does not depend on an a priori model for the temperature dependence of the penetration depth. The ability of this technique to be employed as a standard for characterization of HTS films for microwave applications is pointed out.
Keywords :
penetration depth (superconductivity); superconducting materials; superconducting thin films; absolute penetration depth; cryogenic linear stage; liquid N/sub 2/ filled dielectric spacer; modified parallel plate transmission line resonator; penetration depth; superconductors; surface resistance; variable spacing parallel plate resonator; Cryogenics; Dielectric liquids; Dielectric measurements; Frequency estimation; Nitrogen; Q factor; Resonant frequency; Surface resistance; Temperature dependence; Transmission line measurements;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.784900
Filename :
784900
Link To Document :
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