Title :
Direct generalised characteristic model extraction for high-speed interconnects
Author :
Ip, S.K. ; Chang, F.Y.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
fDate :
5/27/1999 12:00:00 AM
Abstract :
A direct method for extracting the time-domain generalised characteristic model for microstrip interconnects in high-speed circuits is presented. The method proposed uses discrete-time numerical convolution, deconvolution and self-convolution roots to calculate the characteristic impedance and the propagation function directly from the terminal responses obtained by the FDTD method. Simulated results demonstrate that it is 56.55% faster than the waveform relaxation extraction method.
Keywords :
integrated circuit interconnections; FDTD method; VLSI; characteristic impedance; deconvolution; discrete-time numerical convolution; high-speed circuits; microstrip interconnects; propagation function; self-convolution roots; terminal responses; time-domain generalised characteristic model;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19990601