DocumentCode :
1549445
Title :
Subthreshold CMOS voltage reference circuit with body bias compensation for process variation
Author :
Luo, Haipeng ; Han, Yi ; Cheung, Ray C. C. ; Liang, Guozheng ; Zhu, Dalong
Author_Institution :
Dept. of ISEE, Zhejiang Univ., Hangzhou, China
Volume :
6
Issue :
3
fYear :
2012
fDate :
5/1/2012 12:00:00 AM
Firstpage :
198
Lastpage :
203
Abstract :
This study presents a subthreshold complementary metal oxide semiconductor (CMOS) voltage reference circuit that adopts dynamical body bias to compensate the process-related reference voltage fluctuation. The proposed circuit generates a mean reference voltage of 0.781 V at 1.2 V supply and 27°C, reduces the standard deviation (σ) of the reference voltage from 11 mV to only 3 mV, and meanwhile improves the power supply rejection ratio from -30.7 to -51.4 dB. The average temperature coefficient measured from 0 to 100°C is 48 ppm/°C, and the line regulation is 0.34%/V in a supply voltage ranging from 1.2 to 2.3 V. The maximum supply current is 8.1 μA at 1.2 V supply and 100°C, and the chip area is 0.0533 mm2 in 0.13-μm CMOS technology.
Keywords :
CMOS integrated circuits; reference circuits; body bias compensation; complementary metal oxide semiconductor circuit; current 8.1 muA; dynamical body bias; line regulation; power supply rejection ratio; process variation; process-related reference voltage fluctuation compensation; size 0.13 mum; subthreshold CMOS voltage reference circuit; temperature 0 degC to 100 degC; voltage 0.781 V; voltage 1.2 V to 2.3 V;
fLanguage :
English
Journal_Title :
Circuits, Devices & Systems, IET
Publisher :
iet
ISSN :
1751-858X
Type :
jour
DOI :
10.1049/iet-cds.2011.0170
Filename :
6226935
Link To Document :
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