• DocumentCode
    1551907
  • Title

    Validating complex computer system availability models

  • Author

    Wein, Anne S. ; Sathaye, Archana

  • Author_Institution
    Digital Equipment Corp., Andover, ME, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1990
  • fDate
    10/1/1990 12:00:00 AM
  • Firstpage
    468
  • Lastpage
    479
  • Abstract
    The authors report on experiences in validating complex computer-system availability models. A validation process, the availability models, and the data-collection process are described. An iteration of the model validation process emphasizing discrepancies between observed system behavior from data and from the model assumptions is presented. Analysis of data from five sites revealed that interruption dependencies on a device and across devices within a system exist. Furthermore, the frequency of, dependencies between, and downtime of device interruptions constitute differentiating characteristics of the causes of device interruptions. Data on partially available machine states, nonexponentially distributed machine downtimes, and nonstationarity of the machine interruption process are included. Validating the model assumptions is essential to model interpretation. Model accuracy is assessed. Exponentially distributed times between interruptions on a device and exponentially distributed device downtimes are not significant with respect to average measures of availability. The benefits of and issues for availability-model validation are summarized
  • Keywords
    computer installation; fault tolerant computing; reliability; availability models; computer system availability; data-collection process; downtime; interruption dependencies; observed system behavior; validation process; Availability; Coupled mode analysis; Data analysis; Design engineering; Engineering management; Frequency; Reliability engineering; System performance; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.58724
  • Filename
    58724