DocumentCode
155241
Title
A simulation study of a miniature parallel ECT sensor
Author
Zhen Ren ; Wuqiang Yang
Author_Institution
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear
2014
fDate
14-17 Oct. 2014
Firstpage
144
Lastpage
147
Abstract
Electrical capacitance tomography (ECT) has been developed successfully for industrial applications. While most ECT sensors employ a circular structure with a closed sensing area, some other structures like square and parallel are needed for some particular applications. This paper describes a parallel structure ECT sensor, which can provide incomplete measurement data only. The performance of this parallel ECT sensor is discussed based on simulation study with 2D FEM models. Images of different permittivity distributions are generated by linear back-projection (LBP) and Landweber iteration algorithms. The effect of the effective sensing area and distance of parallel plates are also discussed. Both capacitance residual and correlation coefficient are used to evaluate the image quality. The results show that (1) the width of the sensing area should be the same as the shielding layer in order to acquire high quality image and (2) the distance between two parallel plates is suggested being equal to the shielding layer to compromise the sensing space and the sensitivity of the central region.
Keywords
capacitance measurement; capacitive sensors; computerised instrumentation; correlation methods; electric impedance imaging; electric impedance measurement; finite element analysis; image sensors; iterative methods; 2D FEM model; LBP generation; Landweber iteration algorithm; correlation coefficient; electrical capacitance tomography; image acquisition; image quality; industrial application; linear back-projection generation; miniature parallel ECT sensor; parallel structure; permittivity distribution; shielding layer; square structures; Capacitance; Correlation coefficient; Electrodes; Finite element analysis; Image reconstruction; Sensitivity; Sensors; ECT; incomplete measurement; parallel sensor;
fLanguage
English
Publisher
ieee
Conference_Titel
Imaging Systems and Techniques (IST), 2014 IEEE International Conference on
Conference_Location
Santorini
Type
conf
DOI
10.1109/IST.2014.6958462
Filename
6958462
Link To Document