• DocumentCode
    1553036
  • Title

    Roadmaps and visions for design and test

  • Author

    Joyner, William H., Jr. ; Kahng, Andrew B.

  • Author_Institution
    University of California
  • Volume
    18
  • Issue
    6
  • fYear
    2001
  • Firstpage
    4
  • Lastpage
    5
  • Keywords
    Algorithm design and analysis; Circuit testing; Computer science; Costs; Electronic design automation and methodology; Electronics industry; Mathematics; Semiconductor device testing; Software design; Transistors;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2001.970414
  • Filename
    970414
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1553036