• DocumentCode
    1553387
  • Title

    New model extraction for predicting distortion in HEMT and MESFET circuits

  • Author

    Qu, Guoli ; Parker, Anthony E.

  • Author_Institution
    Dept. of Electron., Macquarie Univ., Sydney, NSW, Australia
  • Volume
    9
  • Issue
    9
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    363
  • Lastpage
    365
  • Abstract
    A new method is presented for extracting Taylor series coefficients directly from IM measurements for modeling IM distortion in HEMT and MESFET circuits. It is based on an improved model that uses better simplifying assumptions. The method gives a substantially more accurate characterization, especially in the saturation region, required for amplifier designs
  • Keywords
    HEMT circuits; MESFET circuits; intermodulation distortion; microwave amplifiers; microwave circuits; HEMT circuits; IM distortion; IM measurements; MESFET circuits; Taylor series coefficients; amplifier designs; distortion; model extraction; saturation region; Data mining; Differential equations; Distortion measurement; HEMTs; Intermodulation distortion; MESFET circuits; Nonlinear distortion; Predictive models; Switches; Taylor series;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/75.790475
  • Filename
    790475