DocumentCode
1553395
Title
Implementation and calibration of a two-port electrooptic network analyzer
Author
Elamaran, Balasundaram ; Pollard, Roger D. ; Iezekiel, Stavros
Author_Institution
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
Volume
9
Issue
9
fYear
1999
fDate
9/1/1999 12:00:00 AM
Firstpage
369
Lastpage
371
Abstract
A novel bidirectional electrooptic network analyzer has been demonstrated which enables the full S-parameter characterization of both electrooptic (E/O) and optoelectronic (O/E) components using a single connection of the device-under-test to the test ports. A combined two-tier E/O and O/E calibration is proposed. Measurement results which validate both the analyzer architecture and the calibration are presented
Keywords
S-parameters; calibration; electro-optical devices; network analysers; optical testing; optoelectronic devices; S-parameter characterization; analyzer architecture; bidirectional network analyzer; calibration; optoelectronic components; two-port electrooptic network analyzer; Calibration; Diode lasers; Directional couplers; Electrooptic devices; Optical coupling; Optical devices; Optical fiber networks; Optical modulation; Photodiodes; Testing;
fLanguage
English
Journal_Title
Microwave and Guided Wave Letters, IEEE
Publisher
ieee
ISSN
1051-8207
Type
jour
DOI
10.1109/75.790477
Filename
790477
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