Title :
Measurement of mode field profiles and bending and transition losses in curved optical channel waveguides
Author :
Subramaniam, Vijaya ; De Brabander, Gregory N. ; Naghski, David H. ; Boyd, Joseph T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Cincinnati Univ., OH, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
Curved, single-mode, silicon oxynitride optical ridge channel waveguides have been characterized by measuring mode field profile alteration, bending loss, and transition loss. The results were compared to theoretical calculations. Near field imaging of the channel mode field profiles showed the effect of bend radius on mode shape. Good agreement was obtained between the measurements and profiles obtained from two-dimensional (2-D) beam propagation method calculations. The exponential dependence of bending loss on bend radius and the variation of transition loss on the lateral offset between channels having different bend radius were successfully modeled by two simple theories
Keywords :
bending; integrated optics; optical loss measurement; optical waveguide theory; optical waveguides; ridge waveguides; silicon compounds; 2D beam propagation method calculations; bend radius; bending loss measurement; channel mode field profiles; curved optical channel waveguides; exponential dependence; integrated optics; lateral offset; mode field profile alteration; mode field profiles; mode shape; near field imaging; silicon oxynitride optical ridge channel waveguides; transition loss; transition losses; Computer science; Integrated optics; Loss measurement; Optical interconnections; Optical losses; Optical propagation; Optical waveguide theory; Optical waveguides; Two dimensional displays; Waveguide transitions;
Journal_Title :
Lightwave Technology, Journal of
