Title :
A Bayesian approach to characterizing uncertainty in inverse problems using coarse and fine-scale information
Author :
Higdon, Dave ; Lee, Herbert ; Bi, Zhuoxin
Author_Institution :
Los Alamos Nat. Lab., NM, USA
fDate :
2/1/2002 12:00:00 AM
Abstract :
The Bayesian approach allows one to easily quantify uncertainty, at least in theory. In practice, however, the Markov chain Monte Carlo (MCMC) method can be computationally expensive, particularly in complicated inverse problems. We present a methodology for improving the speed and efficiency of an MCMC analysis by combining runs on different scales. By using a coarser scale, the chain can run faster (particularly when there is an external forward simulator involved in the likelihood evaluation) and better explore the posterior, being less likely to become stuck in local maxima. We discuss methods for linking the coarse chain back to the original fine-scale chain of interest. The resulting coupled chain can thus be run more efficiently without sacrificing the accuracy achieved at the finer scale
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; hydrology; image reconstruction; image sampling; inverse problems; single photon emission computed tomography; uncertainty handling; Bayesian approach; MCMC analysis; Markov chain Monte Carlo method; SPECT application; coarse chain; coarse scale information; coupled chain; fine-scale chain; fine-scale information; forward simulator; hydrology; imaging problem; inverse problems; likelihood evaluation; single photon emission computed tomography; uncertainty; Bayesian methods; Bismuth; Computational modeling; Inverse problems; Joining processes; Monte Carlo methods; Parallel processing; Stochastic processes; Tomography; Uncertainty;
Journal_Title :
Signal Processing, IEEE Transactions on