Title :
Measurement-based nonlinear modeling of spectral regrowth
Author :
Moer, Wendy Van ; Rolain, Yves ; Geens, Alain
Author_Institution :
Electr. Meas. Dept., Vrije Univ., Brussels, Belgium
fDate :
12/1/2001 12:00:00 AM
Abstract :
This paper investigates the ability of nonlinear models extracted from measured continuous wave amplifier data to predict the amplifier response to modulated signals in compression. Experimental verification of the nonlinear model prediction is performed using nonlinear vectorial network analyzer measurements
Keywords :
S-parameters; UHF amplifiers; UHF measurement; Volterra series; linearisation techniques; microwave amplifiers; microwave measurement; modulation; network analysers; nonlinear network analysis; spectral analysis; Laplace model; S-parameters; Volterra input-output map; Volterra series; absolute calibration; amplifier response; continuous wave amplifier data; linearization; measurement-based nonlinear modeling; microwave measurements; modulated signals in compression; multidimensional transfer function; nonlinear VNA measurements; polynomial Volterra model; single-tone excitation; soft nonlinearities; spectral regrowth; Data mining; Frequency; Kernel; Nonlinear equations; Nonlinear systems; Performance analysis; Performance evaluation; Polynomials; Power system modeling; Predictive models;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
