DocumentCode :
1561126
Title :
19.2% efficiency n-type laser-grooved silicon solar cells
Author :
Guo, Jiun-Hua ; Tjahjono, Budi S. ; Cotter, Jeffrey E.
Author_Institution :
Centre of Excellence for Adv. Silicon Photovoltaics & Photonics, New South Wales Univ., Sydney, NSW, Australia
fYear :
2005
Firstpage :
983
Lastpage :
986
Abstract :
N-type silicon wafers have been found to have higher bulk lifetimes compared to those of boron-doped p-type silicon wafers with the same resistivity, and proved to have no light-induced degradation associated with the boron-oxygen complex. In this paper, the laser-grooved buried contact (BC) technology was used to fabricate interdigitated backside contact (IBC) solar cells on the phosphorus-doped silicon wafers. Three obstacles that hindered the performance of n-type interdigitated backside buried contact (IBBC) solar cells - parasitic shunt resistance, metallization issues, and optimization of the diffused regions - are discussed. 19.2% efficiency has been achieved on the n-type IBBC solar cell, and all BC solar cells made on the phosphorus-doped n-type silicon wafers, regardless of the crystalline growth techniques, show no light-induced degradation.
Keywords :
antireflection coatings; diffusion; electrical resistivity; elemental semiconductors; laser materials processing; semiconductor device metallisation; silicon; solar cells; 19.2 percent; Si; boron-doped p-type silicon wafers; boron-oxygen complex; laser-grooved buried contact; light-induced degradation; metallization; n-type interdigitated backside buried contact solar cells; n-type laser-grooved silicon solar cells; n-type silicon wafers; parasitic shunt resistance; phosphorus-doped silicon wafers; resistivity; Conductivity; Crystallization; Degradation; Metallization; Optical design; Photovoltaic cells; Silicon; Stability; State feedback; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
ISSN :
0160-8371
Print_ISBN :
0-7803-8707-4
Type :
conf
DOI :
10.1109/PVSC.2005.1488297
Filename :
1488297
Link To Document :
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