Title :
The reliability of isotropically conductive adhesive as solder replacement - a case study using LCP substrate
Author :
Kuusiluoma, S. ; Kiilunen, J.
Author_Institution :
Tampere Univ. of Technol.
Abstract :
In this study, the reliability of isotropically conductive adhesive (ICA) attachments on liquid crystal polymer (LCP) substrate was compared to the reliability of lead-free solder (SnAgCu) attachments on same substrate material. The assembled components were similar surface mount components and the reliability was assessed through real-time measurements of contact resistance of each connection. The devices were subjected to two environmental stress tests, a thermal cycle test and a sinusoidal vibration. Results show that when using LCP as a substrate material, the reliability of the device under thermal cyclic stress is somewhat inferior to the reliability of SnAgCu solder. No significant differences could however be perceived from the vibration test results since none of the assemblies failed in the test. The failure analysis revealed that most failures occured at the interface between component lead and the attachment material in both cases, but the test methods need to be developed to make further conclusions
Keywords :
adhesives; contact resistance; copper alloys; failure analysis; liquid crystal polymers; reliability; silver alloys; solders; tin alloys; LCP substrate; SnAgCu; contact resistance; environmental stress tests; failure analysis; isotropically conductive adhesive; lead-free solder attachments; liquid crystal polymer substrate; sinusoidal vibration test; solder replacement; surface mount components; thermal cycle test; Assembly; Conducting materials; Conductive adhesives; Environmentally friendly manufacturing techniques; Independent component analysis; Lead; Liquid crystal polymers; Materials reliability; Testing; Thermal stresses;
Conference_Titel :
Electronic Packaging Technology Conference, 2005. EPTC 2005. Proceedings of 7th
Conference_Location :
Singapore
Print_ISBN :
0-7803-9578-6
DOI :
10.1109/EPTC.2005.1614503