DocumentCode :
1562582
Title :
Noise-constrained interconnect optimization for nanometer technologies
Author :
Elgamel, Mohamed A. ; Tharmalingam, Kannan S. ; Bayoumi, Magdy A.
Author_Institution :
Center for Adv. Comput. Studies, Southwestern Louisiana Univ., Lafayette, LA, USA
Volume :
5
fYear :
2003
Abstract :
Wide, thick wiring, clock frequency in the GHz range will require interconnection analysis to consider inductance and inductive coupling effects on interconnect delay and noise. Analytical expressions are preferred because simulation is always expensive and ineffective in use with modem designs containing millions of transistors and wires. However, analytical expressions are not sufficiently accurate and do not consider all of interconnect and driver parameters. In this paper, we try to merge between analytical models and a table lookup approach to easily get the crosstalk peak noise, as well as impact of coupling on aggressor delay. The pulse width of the crosstalk noise, which is of similar importance for circuit performance as the peak amplitude, is also measured. We consider parameters like spacing, length, coupling length, place of overlap (near driver or receiver side), frequency, direction of the signals, load capacitance, rise time of the inputs, wire width for both the aggressors and the victim wires. Also, we consider parameters like shields and shield width to decrease the inductive coupling.
Keywords :
VLSI; capacitance; circuit optimisation; crosstalk; inductance; integrated circuit interconnections; integrated circuit modelling; aggressor delay; circuit performance; clock frequency; coupling length; crosstalk peak noise; inductance; inductive coupling effects; interconnection analysis; load capacitance; nanometer technologies; noise-constrained interconnect optimization; overlap; pulse width; rise time; shield width; table lookup; victim wires; wire width; Analytical models; Clocks; Coupling circuits; Crosstalk; Driver circuits; Frequency; Integrated circuit interconnections; Pulse measurements; Wires; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
Type :
conf
DOI :
10.1109/ISCAS.2003.1206323
Filename :
1206323
Link To Document :
بازگشت