DocumentCode :
1562804
Title :
Ellipse detection based on improved-GEVD technique
Author :
Yang, Zhong-gen ; Jiang, Gui-Xiang ; Ren, Lei
Author_Institution :
Dept. of Electron. Eng., Shanghai Maritime Univ., China
Volume :
5
fYear :
2004
Firstpage :
4181
Abstract :
The standard generalized eigen value decomposition (GEVD) is a popular ellipse detection technique whose statistical analysis is given to prove its disadvantages of very big estimation bias and MSE. It is also proved that the effective measurement to improve the performance of ellipse detection is whitening the data noise and regularizing data observation. This theoretic analysis has strongly supported the Hartley´s regularization method. Then, an improved-GEVD algorithm has been developed. The theoretical analysis and computer simulation experiments have demonstrated that the proposed technique has the advantages that it is intrinsically able to whiten the data noise and to regularize the data observation so as to output a non-biased estimation of ellipse parameter with very small MSE. Furthermore, the computation complex is largely simplified.
Keywords :
computational complexity; curve fitting; eigenvalues and eigenfunctions; image recognition; mean square error methods; parameter estimation; statistical analysis; Hartley regularization method; MSE; computation complex; computer simulation; data noise; data observation; ellipse detection; ellipse parameter; generalized eigen value decomposition; nonbiased estimation; statistical analysis; Colored noise; Computer simulation; Data mining; Equations; Image recognition; Matrix decomposition; Noise measurement; Parameter estimation; Robot vision systems; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2004. WCICA 2004. Fifth World Congress on
Print_ISBN :
0-7803-8273-0
Type :
conf
DOI :
10.1109/WCICA.2004.1342296
Filename :
1342296
Link To Document :
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