Title :
Technological optimization of the microwave hybrid and monolithic integrated circuits
Author :
Agasieva, S.V. ; Leushin, V.Yu. ; Meshkov, S.A. ; Popov, V.V. ; Makeev, M.O.
Author_Institution :
Moscow State Tech. Univ. n.a. N.E. Bauman, Moscow, Russia
Abstract :
The methodology of increasing of serial applicability indicators and reliability of microwave hybrid and monolithic integrated circuits (HIC and MIC) is offered. The modern MIC element base consists of multilayered semiconductor heterostructures. The methodology is based on modeling of degradation processes of microwave HIC and MIC heterostructure under the influence of external factors and development of technological optimization methods.
Keywords :
MMIC; circuit optimisation; hybrid integrated circuits; integrated circuit reliability; HIC reliability; MIC element base; MIC reliability; degradation process modeling; microwave hybrid integrated circuits; monolithic integrated circuits; multilayered semiconductor heterostructures; technological optimization method; Life estimation;
Conference_Titel :
Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-412-5
DOI :
10.1109/CRMICO.2014.6959575
