DocumentCode :
1564817
Title :
Test Wafer Management and Automated Wafer Sorting
Author :
Faruqi, Aziza ; Goss, Raymond ; Adhikari, Diwas ; Kowtsch, Thomas
Author_Institution :
Adv. Micro Devices, Austin, TX
fYear :
2008
Firstpage :
322
Lastpage :
326
Abstract :
Typical usage of test wafers (TW) in semiconductor manufacturing involves testing and development of new processes, equipment qualification, and process monitoring activities. A 300 mm fab can potentially spend millions of dollars each year purchasing test wafers. Over the years, improvements in TW management systems have led to a reduction in cost by enabling better inventory control. However, even with the increased level of automation of 300 mm fabs, the TW management process still leaves much to be automated. In this paper, we describe an automated TW management system and the performance benefits derived from its usage.
Keywords :
process monitoring; semiconductor device manufacture; test equipment; automated wafer sorting; process monitoring; semiconductor manufacturing; test wafer management; Automatic testing; Costs; Inventory control; Inventory management; Manufacturing processes; Monitoring; Qualifications; Semiconductor device manufacture; Semiconductor device testing; Sorting; Equipment Qualification; Factory Automation; Sorter Automation; Test Wafer Management; Wafer Sorting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference, 2008. ASMC 2008. IEEE/SEMI
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
978-1-4244-1964-7
Electronic_ISBN :
1078-8743
Type :
conf
DOI :
10.1109/ASMC.2008.4529062
Filename :
4529062
Link To Document :
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