DocumentCode
157119
Title
Optical constants Cu2 ZnSnS4 thin films deposited at different substrate temperatures
Author
Touati, R. ; Ben Rabeh, M. ; Kanzari, M.
Author_Institution
Lab. de Photovoltaique et Mater. Semicond. ENIT, Univ. de Tunis El Manar Tunis, Tunis, Tunisia
fYear
2014
fDate
25-27 March 2014
Firstpage
113
Lastpage
118
Abstract
In this paper, optical properties of Cu2ZnSnS4 (CZTS) thin films grown by thermal evaporation under vacuum method were studied. The samples were deposited at different glass substrate temperatures ranging from Room temperature to 175°C. The optical constants such as refractive index, absorption and extinction coefficients were calculated using the optical measurements in the spectral range of 300-1800 nm. The Swanepoel´s envelope method was used to determine the refractive index which can be extrapolated by Cauchy dispersion relationship. The dispersion of the refractive index is discussed in terms of the single oscillator model proposed by Wemple and DiDomenico. By using this model, i.e. by plotting (n2-1)-1 against (hv)2 and fitting a straight line, oscillator parameters, E0 the single oscillator energy and Ed the dispersion energy, were directly determined. The calculated refractive index was found to be in the range of 2.66-3.91 and the absorption coefficient was higher than 104 cm-l measured in the VIS-NIR region. The electric free carrier susceptibility (Xe) and the carrier concentration on the effective mass ratio (N/m*) were evaluated according to Spitzer-Fan model.
Keywords
absorption coefficients; carrier density; coating techniques; copper compounds; extinction coefficients; liquid phase deposition; refractive index; semiconductor thin films; tin compounds; vapour deposition; zinc compounds; CZTS thin films; Cauchy dispersion relationship; Cu2ZnSnS4; Spitzer-Fan model; Swanepoels envelope method; VIS-NIR region; absorption coefficients; carrier concentration; dispersion energy; electric free carrier susceptibility; extinction coefficients; glass substrate temperatures; optical constants thin films; optical measurements; optical properties; refractive index; single oscillator energy; temperature 25 degC to 175 degC; thermal evaporation; vacuum method; wavelength 300 nm to 1800 nm; Absorption; Dispersion; Optical films; Optical refraction; Optical variables control; Refractive index; Substrates; CZTS; Cu2ZnSnS4; optical constants; thin films; vacuum evaporation;
fLanguage
English
Publisher
ieee
Conference_Titel
Green Energy, 2014 International Conference on
Conference_Location
Sfax
Print_ISBN
978-1-4799-3601-4
Type
conf
DOI
10.1109/ICGE.2014.6835407
Filename
6835407
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