DocumentCode
157155
Title
A tridimensional radiated emission model based on an improved near field scan technique
Author
Shall, H. ; Alameh, Kamal ; Riah, Z. ; Alaeddine, Ali ; Kadi, Moncef
Author_Institution
Electron. & Syst. Dept., IRSEEM/ESIGELEC, St. Etienne, France
fYear
2014
fDate
25-27 March 2014
Firstpage
240
Lastpage
245
Abstract
This paper presents a tridimensional radiated emission modeling approach based on near field measured data. The proposed model is a set of equivalent sources distributed on a five surfaces of a volume surrounding the device under test; tangential electromagnetic cartographies are used to build the model. Therefore, a tridimensional near field measurement technique has been set up and the near field test bench has been automated to perform a tridimensional scan in order to collect the radiated field cartographies around the device under test. This measurement technique is very useful to evaluate the electromagnetic radiation of structures having tridimensional geometrical forms with a less time measurement and without identifying potential discontinuities for a more accurate model. Obtained results enable us to validate the near field scan technique as well as the tridimensional modeling approach.
Keywords
cartography; electric noise measurement; electromagnetic interference; device under test; electromagnetic radiation; near field measured data; near field scan technique; near field test bench; radiated field cartographies; tangential electromagnetic cartographies; tridimensional geometrical forms; tridimensional near field measurement technique; tridimensional radiated emission model; Electric variables measurement; Magnetic field measurement; Magnetic fields; Measurement techniques; Probes; Solid modeling; Three-dimensional displays; 3D near-field scan; 3D radiated emisson model; equivalent sources; near-field test bench;
fLanguage
English
Publisher
ieee
Conference_Titel
Green Energy, 2014 International Conference on
Conference_Location
Sfax
Print_ISBN
978-1-4799-3601-4
Type
conf
DOI
10.1109/ICGE.2014.6835428
Filename
6835428
Link To Document