• DocumentCode
    1573131
  • Title

    A Comparative Analysis of Software Reliability Growth Models using Defects Data of Closed and Open Source Software

  • Author

    Ullah, Najeeb ; Morisio, Maurizio ; Vetro, Antonio

  • fYear
    2012
  • Firstpage
    187
  • Lastpage
    192
  • Abstract
    The purpose of this study is to compare the fitting (goodness of fit) and prediction capability of eight Software Reliability Growth Models (SRGM) using fifty different failure Datasets. These data sets contain defect data collected from system test phase, operational phase (field defects) and Open Source Software (OSS) projects. The failure data are modelled by eight SRGM (Musa Okumoto, Inflection S-Shaped, Goel Okumoto, Delayed S-Shaped, Logistic, Gompertz, Yamada Exponential, and Generalized Goel Model). These models are chosen due to their prevalence among many software reliability models. The results can be summarized as follows o Fitting capability: Musa Okumoto fits all data sets, but all models fit all the OSS datasets. o Prediction capability: Musa Okumoto, Inflection S-Shaped and Goel Okumoto are the best predictors for industrial data sets, Gompertz and Yamada are the best predictors for OSS data sets. o Fitting and prediction capability: Musa Okumoto and Inflection are the best performers on industrial datasets. However this happens only on slightly more than 50% of the datasets. Gompertz and Inflection are the best performers for all OSS datasets.
  • Keywords
    Accuracy; Analytical models; Data models; Predictive models; Software; Software reliability; Failure Data; Open Source Software; SRGM; Software Reliability Growth Models; Software Reliability Models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Workshop (SEW), 2012 35th Annual IEEE
  • Conference_Location
    Heraclion, Crete, Greece
  • ISSN
    1550-6215
  • Print_ISBN
    978-1-4673-5574-2
  • Type

    conf

  • DOI
    10.1109/SEW.2012.26
  • Filename
    6479816