DocumentCode :
1574185
Title :
High voltage gain MESFET amplifier using self-aligned MOCVD grown planar GaAs nanowires
Author :
Chen Zhang ; Dowdy, Ryan ; Xiuling Li
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
fYear :
2013
Firstpage :
63
Lastpage :
64
Abstract :
We have recently demonstrated the growth of self-aligned unidirectional GaAs planar nanowires (NWs) on GaAs (110) substrate by MOCVD through Au-catalyzed vapor-liquid-solid (VLS) mechanism [1]. These planar NWs, in contrast with the vertically aligned ones, are compatible with traditional planar processing and thus very promising for realizing NW based circuits in a deterministic manner. GaAs MESFETs have been widely used as components of amplifiers in microwave applications. However, MESFETs often show low output resistance, thus low voltage gain for the amplifiers resulting from the large channel length modulation effect [2]. This is because the thick depletion layer that exists between gate and the actual conducting channel degrades the gate control, which is similar to the case in MOSFETs. It is anticipated that a nanowire (NW) channel with multi-gate structure can improve the gate electrostatics and reduce the channel length modulation effect as a result. Here we present a gate length scaling study of planar NW MESFETs and demonstrate a simple amplifier using them.
Keywords :
III-V semiconductors; MESFET integrated circuits; MOCVD; gallium arsenide; gold; microwave amplifiers; nanowires; Au; GaAs; GaAs planar nanowires; MESFET amplifier; MOSFET; NW based circuits; gate electrostatics; gate length scaling study; large channel length modulation effect; multigate structure; nanowire channel; planar GaAs nanowires; planar NW MESFET; self-aligned MOCVD; self-aligned unidirectional nanowire; thick depletion layer; vapor-liquid-solid mechanism; Arrays; Gallium arsenide; Gold; Logic gates; MESFETs; Modulation; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2013 71st Annual
Conference_Location :
Notre Dame, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4799-0811-0
Type :
conf
DOI :
10.1109/DRC.2013.6633794
Filename :
6633794
Link To Document :
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