Title :
Thin-film interference effect in scattering loss of high-index-contrast planar waveguides
Author :
Schmid, J.H. ; Delâge, A. ; Lapointe, J. ; Lamontagne, B. ; Janz, S. ; Cheben, P. ; Densmore, A. ; Xu, D. -X ; Yap, K.P.
Author_Institution :
Inst. for Microstruct. Sci., Nat. Res. Council Canada, Ottawa, ON
Abstract :
We show by theoretical analysis and experiments on submicrometer silicon-on-insulator channel waveguides that the optical scattering loss of high-index-contrast planar waveguides is modified significantly by a thin-film interference effect, caused by boundary reflections.
Keywords :
light interference; light scattering; optical films; optical losses; optical planar waveguides; silicon-on-insulator; thin films; Si-SiO2; boundary reflection; high-index-contrast planar waveguides; optical scattering loss; submicrometer silicon-on-insulator channel waveguides; thin-film interference effect; Cause effect analysis; Interference; Optical losses; Optical planar waveguides; Optical scattering; Optical waveguide theory; Optical waveguides; Planar waveguides; Silicon on insulator technology; Transistors; SOI; Scattering; loss; photonic wire; roughness; siliconon-insulator; waveguide;
Conference_Titel :
IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Conference_Location :
Acapulco
Print_ISBN :
978-1-4244-1931-9
Electronic_ISBN :
978-1-4244-1932-6
DOI :
10.1109/LEOS.2008.4688869
