DocumentCode
1576893
Title
Uncertainty specification for Data Acquisition Devices (DAQ)
Author
Braudaway, David W.
Volume
2
fYear
2003
Firstpage
946
Abstract
Specification of uncertainties has historically been done by a variety of methods with differences in the results, especially for instruments and standards that achieve small values of uncertainty. This problem has been addressed in the new Draft being considered for IEC Standard on Data Acquisition Devices (DAQ) by use of coverage factor rather than other popular methods of specifying uncertainty. The source and history of statistics/uncertainty are reviewed; popular current techniques for specifying uncertainty are compared. The components of uncertainty specified for DAQ are reviewed and their effects discussed.
Keywords
data acquisition; statistics; uncertain systems; coverage factor; data acquisition device; expanded uncertainty; uncertainty specification; Calibration; Costs; Data acquisition; IEC standards; Instruments; Laboratories; Manufacturing; Measurement standards; Measurement uncertainty; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1207892
Filename
1207892
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