Title :
Time-resolved error vector magnitude for transmitter mask testing in coherent optical transmission systems
Author :
Sunnerud, Henrik ; Westlund, Mathias ; Sköld, Mats ; Andrekson, Peter A.
Author_Institution :
EXFO Sweden AB, Gothenburg, Sweden
Abstract :
We propose a novel transition-sensitive measurement approach for coherent optical systems. The time-resolved error vector magnitude (EVM), combined with mask testing, is a powerful tool for pass/fail testing of transmitters in coherent systems.
Keywords :
light coherence; optical testing; optical transmitters; coherent optical transmission system; pass-fail testing; time-resolved error vector magnitude; transition-sensitive measurement approach; transmitter mask testing; Adaptive optics; Constellation diagram; Optical receivers; Optical transmitters; Optical variables measurement; Testing;
Conference_Titel :
Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2011 and the National Fiber Optic Engineers Conference
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4577-0213-6
