Title :
Resonant circuit model evaluation using reflected S-parameter data
Author :
Vanzura, Eric J. ; Rogers, Janet E.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Nonlinear regression is used to fit S-parameter resonance data to a full-circuit model that includes coupling factors and self impedances. This model fits the data better than the simpler Q-circle model that can be derived from the full-circuit model, but a systematic pattern in the residuals persists. This pattern indicates a discrepancy between the full-circuit model and the observed data. By looking at parameter estimates calculated from subsets of the original data, it is demonstrated that the cause of this discrepancy also could introduce significant errors in the model´s estimated parameter values
Keywords :
S-parameters; circuit resonance; microwave circuits; network analysis; parameter estimation; S-parameter resonance data; coupling factors; full-circuit model; nonlinear regression; parameter estimates; reflected S-parameter data; residuals; resonant circuit model; self impedances; systematic pattern; Apertures; Cavity resonators; Impedance; NIST; Parameter estimation; Q measurement; RLC circuits; Resonance; Resonant frequency; Scattering parameters;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-87942-579-2
DOI :
10.1109/IMTC.1991.161564