Title :
Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison
Author :
Alippi, C. ; Catelani, M. ; Fort, A. ; Mugnaini, M.
Author_Institution :
Politecnico di Milano
Keywords :
Analytical models; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electronic circuits; Electronic equipment testing; Fault diagnosis; Frequency;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208122
