Title :
Lamp flicker measurement and mitigation
Author :
Wang, Chau-Shing ; Devaney, Michael J.
Author_Institution :
University of Missouri-Columbia
Keywords :
Control systems; Frequency; IEC standards; Impedance; Lamps; Lighting control; Measurement standards; Thyristors; Voltage control; Voltage fluctuations;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
Print_ISBN :
0-7803-7705-2
DOI :
10.1109/IMTC.2003.1208180
