Modification of diode X-rays by electron multiple backscatter from anode

In high-power vacuum diodes with high-atomic-number anodes, a large fraction of the electrons are backscattered, thus changing all diode characteristics: the electron and ion currents, the electron beam spectrum, and, finally, the X-ray spectrum and the X-ray efficiency. The latter problem is very important for intense electron beam radiography. Based on the KARAT and Monte Carlo codes, a hybrid PIC/Monte Carlo code is now being developed to examine the above problems. The results of computer simulations are compared with experimental data.