• DocumentCode
    1584565
  • Title

    Micromechanical electrostatic voltmeter

  • Author

    Hsu, C.H. ; Muller, R.S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    1991
  • Firstpage
    659
  • Lastpage
    662
  • Abstract
    The prototype for a microminiature, noncontacting electrostatic voltmeter (ESV) is discussed. The ESV works on the principle of intermittent shuttering and exposing a sensing electrode to an electric field between a remote electrode at a different potential from the sensing electrode. The resultant time-varying field at the electrode produces an electrical signal which can be used to monitor the remote voltage. The prototype ESVs hat have been made and tested have electrostatic-comb drives and shutters with areas ranging from 0.022 to 0.067 mm/sup 2/ that are suspended roughly 2 mu m above the surface of the silicon substrate. Initial tests on ESVs showed them to respond to voltages above 20 V for electrodes spaced 0.2 mm away. Sensitivity is expected to be greatly improved by redesigns that are already being investigated.<>
  • Keywords
    electrostatic devices; micromechanical devices; silicon; voltmeters; 0.2 mm; 20 V; IC; Si; electrostatic-comb drives; intermittent shuttering; micromechanical microminiature voltmeter; noncontacting electrostatic voltmeter; polysilicon microshutter; remote electrode; remote voltage; sensing electrode; time-varying field; Electrodes; Electrostatics; Micromechanical devices; Prototypes; Remote monitoring; Rough surfaces; Surface roughness; Testing; Voltage; Voltmeters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-87942-585-7
  • Type

    conf

  • DOI
    10.1109/SENSOR.1991.148966
  • Filename
    148966