DocumentCode
1585847
Title
High voltage testing of capacitors
Author
Shkuratov, S.I. ; Talantsev, E.F. ; Kristiansen, M. ; Dickens, J.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA
Volume
2
fYear
2001
Firstpage
1559
Abstract
Three different types of capacitor have been tested to determine maximum usable high voltage. The capacitor testing was performed in the dynamic mode. The voltage rise varied from 200 to 400 V/sec. Disc ceramic and thin film capacitors of different value and different nominal voltages were tested. Experiments have shown that the breakdown voltage for all types of the capacitors tested is about ten times more than the nominal voltage of the capacitors. Data are given for the limiting high voltage for each kind of capacitor. Experiments have shown that the mechanisms for the destruction of each type of capacitor have specific features.
Keywords
ceramic capacitors; electric breakdown; high-voltage techniques; pulsed power technology; testing; thin film capacitors; breakdown voltage; capacitor destruction mechanisms; capacitor testing; compact pulsed power systems; disc ceramic film capacitors; high voltage testing; limiting high voltage; thin film capacitors; voltage rise; Capacitors; Ceramics; Circuit testing; Electronic components; Performance evaluation; Probes; Pulse power systems; Resistors; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
Conference_Location
Las Vegas, NV, USA
Print_ISBN
0-7803-7120-8
Type
conf
DOI
10.1109/PPPS.2001.1001859
Filename
1001859
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