• DocumentCode
    1585847
  • Title

    High voltage testing of capacitors

  • Author

    Shkuratov, S.I. ; Talantsev, E.F. ; Kristiansen, M. ; Dickens, J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Tech. Univ., Lubbock, TX, USA
  • Volume
    2
  • fYear
    2001
  • Firstpage
    1559
  • Abstract
    Three different types of capacitor have been tested to determine maximum usable high voltage. The capacitor testing was performed in the dynamic mode. The voltage rise varied from 200 to 400 V/sec. Disc ceramic and thin film capacitors of different value and different nominal voltages were tested. Experiments have shown that the breakdown voltage for all types of the capacitors tested is about ten times more than the nominal voltage of the capacitors. Data are given for the limiting high voltage for each kind of capacitor. Experiments have shown that the mechanisms for the destruction of each type of capacitor have specific features.
  • Keywords
    ceramic capacitors; electric breakdown; high-voltage techniques; pulsed power technology; testing; thin film capacitors; breakdown voltage; capacitor destruction mechanisms; capacitor testing; compact pulsed power systems; disc ceramic film capacitors; high voltage testing; limiting high voltage; thin film capacitors; voltage rise; Capacitors; Ceramics; Circuit testing; Electronic components; Performance evaluation; Probes; Pulse power systems; Resistors; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Plasma Science, 2001. PPPS-2001. Digest of Technical Papers
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-7120-8
  • Type

    conf

  • DOI
    10.1109/PPPS.2001.1001859
  • Filename
    1001859