DocumentCode
158805
Title
Compact lumped circuit model of discharges in DC accelerator using partial element equivalent circuit
Author
Banerjee, Sean ; Rajan, R.N. ; Singh, S.K. ; Bakhtsingh, R.I. ; Mittal, Kailash Chandra
Author_Institution
Accel. & Pulse Power Div, Bhabha Atomic Res. Centre, Mumbai, India
fYear
2014
fDate
Sept. 28 2014-Oct. 3 2014
Firstpage
325
Lastpage
328
Abstract
DC Accelerators undergoes different types of discharges during its operation. A model depicting the discharges has been simulated to study the different transient conditions. The paper presents a Physics based approach of developing a compact circuit model of the DC Accelerator using Partial Element Equivalent Circuit (PEEC) technique. The equivalent RLC model aids in analyzing the transient behavior of the system and predicting anomalies in the system. The electrical discharges and its properties prevailing in the accelerator can be evaluated by this equivalent model. A parallel coupled voltage multiplier structure is simulated in small scale using few stages of corona guards and the theoretical and practical results are compared. The PEEC technique leads to a simple model for studying the fault conditions in accelerator systems. Compared to the Finite Element Techniques, this technique gives the circuital representation. The lumped components of the PEEC are used to obtain the input impedance and the result is also compared to that of the FEM technique for a frequency range of (0-200) MHz.
Keywords
finite element analysis; nuclear electronics; particle accelerators; voltage multipliers; DC accelerator compact circuit model; DC accelerator discharges compact lumped circuit model; FEM technique; PEEC lumped component; PEEC technique; Partial Element Equivalent Circuit technique; accelerator system fault condition; circuital representation; corona guard stage; discharge type; electrical discharge; equivalent RLC model; finite element technique; frequency range; input impedance; parallel coupled voltage multiplier structure; partial element equivalent circuit; physics based approach; system anomaly prediction; transient condition; transient system behavior analysis; Conductors; Corona; Discharges (electric); Equivalent circuits; Finite element analysis; Integrated circuit modeling; Mathematical model; Accelerators; Electrical Discharges; FEM; PEEC;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
Conference_Location
Mumbai
Print_ISBN
978-1-4799-6750-6
Type
conf
DOI
10.1109/DEIV.2014.6961685
Filename
6961685
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