DocumentCode :
1590008
Title :
ADC characterization by an eigenvalues method
Author :
Zhang, Jian Qiu ; Ovaska, Seppo J.
Author_Institution :
Inst. of Intelligent Power Electron., Helsinki Univ. of Technol., Espoo, Finland
Volume :
2
fYear :
1998
Firstpage :
1198
Abstract :
A new method called the eigenvalue method, is introduced in this paper. Here the eigenvalues of the sampling data matrix, directly derived from the sampled input data, are used to characterize the signal-to-noise ratio (SNR), and further to estimate the number of effective bits. Various input signals, such as single-tone, dual-tone, or multi-tone can be used to obtain accurate estimation results. In addition, our new method does not have any of the difficulties and problems of the earlier characterization methods. Extensive simulations indicate that the proposed method provides excellent performance with single-tone, dual-tone, and multi-tone test signals. The proposed eigenvalue method also shows remarkable robustness over a truly wide SNR range (well below 10 dB to somewhat over 160 dB)
Keywords :
analogue-digital conversion; eigenvalues and eigenfunctions; integrated circuit testing; singular value decomposition; ADC characterization; dual-tone signals; eigenvalues method; multi-tone signals; robustness; sampled input data; sampling data matrix; signal-to-noise ratio; single-tone signals; test signals; Convergence; Discrete Fourier transforms; Eigenvalues and eigenfunctions; Frequency; Power electronics; Robustness; Sampling methods; Signal to noise ratio; Spectral analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
ISSN :
1091-5281
Print_ISBN :
0-7803-4797-8
Type :
conf
DOI :
10.1109/IMTC.1998.676913
Filename :
676913
Link To Document :
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