• DocumentCode
    1591901
  • Title

    Analog circuit fault diagnosis approach using optimized SVMs based on MST algorithm

  • Author

    Song Guoming ; Jiang Shuyan ; Wang Houjun ; Hong, Liu

  • Author_Institution
    Dept. of Comput. Eng., Chengdu Electromech. Coll., Chengdu, China
  • Volume
    4
  • fYear
    2011
  • Firstpage
    236
  • Lastpage
    240
  • Abstract
    The classification accuracy and efficiency of multiclass SVMs are largely dependent on the SVM combination strategy in analog circuits fault diagnosis. An optimized SVM extension strategy is presented in this paper, which uses minimum spanning tree (MST) algorithm to simplify the SVM structure and decrease the classification errors. By taking the separability measure of fault classes as edge weight of undirected graph extracted from feature space, the tree nodes are generated by bottom-top method, which represents sub-class partition with clustering characteristic. Finally, hierarchical multiclass SVMs are constructed according to the structure of MST obtained. The MST-SVM classifier is expected to improve the diagnosis accuracy because the fault classes with larger margin are preferentially separated. The experimental results on a high-pass filter circuit prove that the MST-SVM method outperforms other conventional SVM approaches in veracity and efficiency of fault diagnosis.
  • Keywords
    analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; feature extraction; high-pass filters; pattern classification; pattern clustering; support vector machines; trees (mathematics); SVM combination strategy; SVM structure; analog circuit fault diagnosis; bottom-top method; classification accuracy; classification error; clustering characteristics; edge weight; fault class; feature space; hierarchical multiclass SVM; high-pass filter circuit; minimum spanning tree algorithm; optimized SVM; separability measure; subclass partition; tree nodes; undirected graph; Accuracy; Analog circuits; Circuit faults; Fault diagnosis; Support vector machines; Testing; Training; MST algorithm; SVM classifier; analog circuits; fault diagnosis; separability measure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8158-3
  • Type

    conf

  • DOI
    10.1109/ICEMI.2011.6037986
  • Filename
    6037986