DocumentCode :
1592758
Title :
An extension of input sample acceptance for SELA MC600 micro-cleaving tool
Author :
Ahmataku, H.B. ; Kipli, Kuryati
Author_Institution :
X-FAB Sarawak Sdn. Bhd., Kuching, Malaysia
fYear :
2010
Firstpage :
183
Lastpage :
186
Abstract :
Minimum input sample size and thickness for SELA MC600, a micro-cleaving tool, is 9 × 6 mm and 0.6 mm respectively. The machine will reject sample which is smaller or thinner than this acceptance value. But, in semiconductor Failure Analysis (FA) laboratories, it is inevitable to face such small and thin sample, for instance, a die from backgrinded wafer. Therefore, a technique named Dual-Edged Cleaving (DEC) is invented to circumvent this restriction.
Keywords :
micromechanical devices; semiconductor device models; DEC; SELA MC600 microcleaving tool; backgrinded wafer; dual-edged cleaving; input sample acceptance; semiconductor failure analysis laboratory; Costs; Crystalline materials; Failure analysis; Ion beams; Laboratories; Milling; Optical microscopy; Particle beam optics; Silicon; Surface cleaning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-6608-5
Type :
conf
DOI :
10.1109/SMELEC.2010.5549535
Filename :
5549535
Link To Document :
بازگشت