DocumentCode
1593071
Title
Partial discharge phenomena in artificial cavity in epoxy cast resin insulation system
Author
Hikita, Masayuki ; Kozako, Masahiro ; Takada, Hajime ; Hirose, Tatsuya ; Higashiyama, Masakazu ; Nakamura, Shuhei ; Umemura, Tokihiro
Author_Institution
Kyusyu Inst. of Technol., Kitakyushu, Japan
fYear
2010
Firstpage
1
Lastpage
5
Abstract
It is crucial for proper insulation design of cast resin transformer to consider voids and delamination which might exist in cast molding because of several surface boundaries between resin and conductor. Such defects in the insulator lead to reduction of the life of the apparatus. In this report, we investigate the relation between the void size and apparent charge of partial discharge (PD) occurring in a model simulating the insulation system of cast resin transformer. It is also important to determine necessary PD detection sensitivity of PD test in a factory as well as in a field. In this paper, we also discuss the detection sensitivity by considering the relation between charge and void radius using formula derived by L.Niemyer, M.Pedersen and their colleagues in the late 1980´s to apply to the case of the cast resin transformer. Experiments were also performed to obtain PD inception voltage (PDIV) of epoxy resin slab including an artificial void with a given size. Investigation was also made on the effect of X-ray irradiation to the epoxy resin on PDIV characteristics.
Keywords
partial discharges; transformer insulation; voids (solid); PD detection sensitivity; PD inception voltage; X-ray irradiation; artificial cavity; cast resin transformer; epoxy cast resin insulation system; partial discharge phenomena; void; Conductors; Delamination; Dielectrics; Epoxy resins; Manufacturing processes; Partial discharges; Power transformer insulation; Slabs; Solid modeling; Surface discharges; X-ray irradiation; cast resin transformer; charge; component; epoxy resin; partial discharge; void size;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
Conference_Location
San Diego, CA
ISSN
1089-084X
Print_ISBN
978-1-4244-6298-8
Type
conf
DOI
10.1109/ELINSL.2010.5549549
Filename
5549549
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