Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

Author

Vongpradhip, Sartid ; Ginige, Athula

Author_Institution

Sch. of Electr. Eng., Univ. of Technol., Sydney, Australia

fYear

1993

Firstpage

65

Lastpage

68

Abstract

A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model

Keywords

application specific integrated circuits; automatic test software; delays; design for testability; fault diagnosis; logic testing; probability; statistical analysis; transient analysis; ASIC; ATPG; I/O detectability; ISCAS85 benchmark circuits; SCOAP; STAFAN; correlation; delay faults; probabilistic technique; statistical testability analysis; stuck at faults; testability measures comparison; transient faults; Automatic test pattern generation; Benchmark testing; Circuit analysis; Circuit faults; Circuit testing; Delay; Scattering; System testing; Systems engineering and theory; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-1375-5

Type

conf

DOI

10.1109/ASIC.1993.410808

Filename

410808