• DocumentCode
    1594366
  • Title

    The Multi-resolution Technology for the X-ray Coherent Scatter Image

  • Author

    Liu, Taihui ; Li, Yanhong ; Xue, Jingli ; Liu, Xixiang

  • Author_Institution
    Comput. Coll., Beihua Univ., Jilin, China
  • fYear
    2012
  • Firstpage
    583
  • Lastpage
    586
  • Abstract
    In this paper, a series of x-ray coherent scatter images have been simulated with the Gaussian distribution theory. The traditional method and the Multi-resolution measure were taken to extract the spectrum curve from images. The comparative results of two methods show that the Multi-resolution is an effective, simple, reliable measure. It confirms the application of Multi-resolution in coherent scatter research before. The Multi-resolution method provides a new way for analysis of the x-ray coherent scatter images.
  • Keywords
    Gaussian distribution; X-ray scattering; image resolution; materials science computing; Gaussian distribution theory; X-ray coherent scatter image; multiresolution and line-scan algorithm; multiresolution technology; spectrum curve; Band pass filters; Educational institutions; Gaussian distribution; Materials; Noise; Reliability; X-ray imaging; Coherent scatter; Gaussian distribution; Multi-resolution analysis; Spectrum; X-ray;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent System Design and Engineering Application (ISDEA), 2012 Second International Conference on
  • Conference_Location
    Sanya, Hainan
  • Print_ISBN
    978-1-4577-2120-5
  • Type

    conf

  • DOI
    10.1109/ISdea.2012.577
  • Filename
    6173274