DocumentCode
15965
Title
3-D Internal Charging Simulation on Typical Printed Circuit Board
Author
Xiao-Jin Tang ; Zhong Yi ; Li-Fei Meng ; Ye-Nan Liu ; Chao Zhang ; Jian-Guo Huang ; Zhi-Hao Wang
Author_Institution
Sci. & Technol. on Reliability & Environ. Eng. Lab., Beijing Inst. of Spacecraft Environ. Eng., Beijing, China
Volume
41
Issue
12
fYear
2013
fDate
Dec. 2013
Firstpage
3448
Lastpage
3452
Abstract
To obtain more accurate results of internal charging effects, a 3-D computation method of internal charging electric field and potential for arbitrary configuration is developed. In this paper, the charging of a typical printed circuit board partially grounded, which is immersed in high energetic electrons, is simulated to illustrate the 3-D method. It includes two steps: 3-D electron transport simulation and internal electric field calculation. The electron transport is simulated using a self-developed software found on GEANT4. The 3-D calculation of internal electric field at charging equilibrium is conducted by solving a set of electrostatic equations by the software COMSOL Multiphysics. On the basis of the above-said method, the 3-D field and potential distributions within the board are obtained. For the purpose of comparison, a simpler 1-D planar dielectric grounded at the back surface is simulated in the same method. From the simulation results, the following conclusions are drawn: grounding has significant influence on electric field distribution, and the maximum field generally occurs at grounding edges or corners. The electric field computed by the 3-D algorithm is much larger than the 1-D simplified method widely used at present and, hence, the 1-D method may neglect crucial risk.
Keywords
electric fields; electronic engineering computing; electrons; printed circuits; 3D electron transport simulation; 3D internal charging simulation; COMSOL multiphysics; GEANT4; electrostatic equations; high energetic electrons; internal charging electric field; printed circuit board; Computational modeling; Dielectrics; Equations; Grounding; Integrated circuit modeling; Mathematical model; Solid modeling; 3-D simulation; Monte Carlo method; internal charging; internal electric field;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2013.2268580
Filename
6549190
Link To Document